Compact hierarchical bipolar transistor modeling with hicum schroter michael chakravorty anjan
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The device is integrated in a 0. Detailed comparison with the original theory is carried out to show the different levels of achievable accuracy of the formulated models. A model hierarchy is introduced, that addresses a variety of requirements encountered during the increasingly complicated task of designing analog and high-frequency circuits. This is achieved by a projection with a triangular matrix containing unities in the main diagonal. Opportunities for innovation are quite good with higher carrier frequencies, since these enable simplicity and low power consumption - opening the door to ubiquitous wireless networking. This book aims to provide a solid basis for the understanding of modern compact models.

An introduction of a new functional form of Green's theorem for inhomogeneous media has enabled us to show that the Ramo-Shockley theorem derived for inhomogeneous media with electrodes maintained at constant potentials is still valid even when the electrode potentials are time-varying. Once taken into account the circuit temperature, the accuracy of circuit simulation is significantly improved. Experimental results obtained from abrupt and linearly graded silicon and linearly graded gallium arsenide junctions are shown to compare satisfactorily with the theoretical predictions. This is mainly a result of the fact that the transit time and thus the minority-carrier charge is chosen as a basic model parameter, which is carefully measured and accurately approximated by analytical expressions throughout the total interesting operating range. It discusses device physics, broadband noise, performance limits, reliability, engineered substrates, and self-assembling nanostructures.

Therefore, in this paper a semi-physical compact transistor model is presented which is proven to be well suited for simulating analog h. The method described is based on very careful measurements of test transistors with different emitter geometries. This is an important precondition for transistor optimization in a circuit and for worst case analysis. Our proof provides a basis for calculations of the instantaneous currents in semiconductor devices using particle simulations such as the Monte-Carlo method since it differentiates clearly the current induced in the electrodes due to the moving charges from the current caused by the time-varying potentials of the electrodes through capacitive couplings among the electrodes. This enables circuit engineers perform the reasonable yield analysis prior to the mass production. The equivalent circuit for each region is separately derived using the transmission line equation with reasonable approximations.

The analysis includes the approximated transport noise model feasible for compact model implementations and a correlated noise model derived from the non quasi-static theory of bipolar transistors. In advanced silicon bipolar technologies very narrow emitter stripes can be realized. Following system theory, the formulated model equations are accurately implemented in Verilog-A using four extra nodes. Finally, the simulator was successfully applied to investigate noise coupling via the substrate The design and optimization of high-speed integrated bipolar circuits requires accurate and physical transistor models. Depletion junction charges and capacitances.

The electric model includes correlated junction noise sources and a proper extraction of the transit times involved in these sources. There are three types of relevant active semiconductor devices: the bipolar junction transistor bjt , the metal-oxide-semiconductor field-effect transistor mosfet and the field-effect transistor operating with a reverse biased gate-source junction. From a modeling point of view, isothermal characterization is indispensable in the development of device models which include self-heating effects. Active devices are the building blocks of negative-feedback amplifiers. The attendant widening of the neutral base layer results in the observed, high-current falloff in f T. An excellent agreement is obtained between the measured and simulated S-parameters. Both modes, as well as the transition from one to the other are investigated by a physical description.

A new large-signal model is implemented in Verilog-A, and is tested for small-signal behavior. This Part I outlines the overall scaling procedure and then fo-cuses on the vertically scaled structure. The study is based on one-dimensional 1D device simulation using a realistic doping and Ge profile as baseline. This allows to adjust the absolute value of the field based on measurements and eliminates the inaccurate square dependence on v ceff. The book begins with an overview on the different device designs of modern bipolar transistors, along with their relevant operating conditions; while the subsequent chapter on transistor theory is subdivided into a review of mostly classical theories, brought into context with modern technology, and a chapter on advanced theory that is required for understanding modern device designs.

As a consequence, the transistors in high-frequency h. Common nonlinear bipolar transistor models thus far neglect the correlation, which deteriorates the model accuracy towards higher frequencies. Comparison to device simulation results show good agreement. A technology-independent, inherently nonlinear approach is proposed for the compact modelling of high-frequency noise in microwave transistors under large-signal operating conditions. The bias dependence of the coherence is studied in several transistor geometries. A hybrid model is proposed and a corresponding formulation of the base impedance is obtained.

This book aims to provide a solid basis for the understanding of modern compact models. Because all noise sources may be considered, no a priori assumption need be made as to which noise sources are dominant in a complicated circuit. The methodology to implement the hybrid model in Verilog-A is discussed. Finally, degradation of base-collector junction was investigated under mixed-mode stress and reveals a predominance of defects induced in the space charge area by impact ionization. The imaginary part of optimum generator admittance is slightly worse than without this effect. It is shown that the upper measuring frequency limit fh of high-speed transistors may drastically be reduced due to the strong influence of parasitic transistor and package parameters e. Also, the results indicate that the calculated four noise parameters based on the extracted noise transit time have a good agreement with the tuner-based noise measurement.

While there is growing demand for wireless bandwidth, the most pressing problem affecting this situation today is the attempt to increase bandwidth by using the same technology with tricks - rather than by using innovation. This book aims to provide a solid basis for the understanding of modern compact models. Expressed in terms of the noise voltage and these components of the noise current, the noise factor is then shown to be a function of four parameters which are independent of the circuit external to the twoport. A second-order function is utilized for modeling excess phase. The overall purpose of this paper including Part I, in this issue is the prediction of the ultimate electrical high-frequency performance potential for SiGeC heterojunction bi-polar transistors under the constraints of practical applications. Starting from a first formulation for the generators, formally derived from a physics-based description of the noise generation mechanisms widely adopted in distributed numerical modeling, mild approximations provide a fully behavioral representation that can be empirically extracted on the basis of measurement data only, and can be easily implemented into commercial computer-aided design tools by means of conventional, uncorrelated noise sources. Such a separation is, e.